Metal fusion bonding – Process – With measuring – testing – indicating – inspecting – or...
Patent
1989-03-08
1990-04-03
Godici, Nicholas P.
Metal fusion bonding
Process
With measuring, testing, indicating, inspecting, or...
228105, 2281802, 228 62, 228 9, 269903, 221155, 221163, 221167, H01L 2160
Patent
active
049133357
ABSTRACT:
Disclosed is a method for die bonding, comprising the steps of arranging a wafer having a multiplicity of mutually separated semiconductor chips vertically and near a lead frame which is conveyed horizontally, and picking up each of the semiconductor chips from the wafer and bonding the same onto the lead frame.
REFERENCES:
patent: 4103814 (1978-08-01), Nishioka
patent: 4342090 (1982-07-01), Caccoma et al.
patent: 4696104 (1987-09-01), Vanzetti et al.
IBM Technical Disclosure Bulletin vol. 28, No. 11, Apr. 1986.
IBM Technical Disclosure Bulletin vol. 29, No. 7, Dec. 1986.
IBM Technical Disclosure Bulletin vol. 30, No. 10, Mar. 1988.
Godici Nicholas P.
Heinrich Samuel M.
Mitsubishi Denki & Kabushiki Kaisha
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