Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
Reexamination Certificate
2005-01-04
2005-01-04
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Mechanical measurement system
Reexamination Certificate
active
06839640
ABSTRACT:
A diagnosing method and apparatus non-destructively performing damage evaluation of a piled up structure of conductive materials by using acoustic waves. The diagnosing method according to the present invention includes the steps of placing an electro-magnetic acoustic transducer20out of contact with a piled up structure34of conductive materials32and34piled up with a non-conductive interface33(35) interposed therebetween, transmitting ultrasonic waves from one side31of the piled up structure by the electro-magnetic acoustic transducer20, receiving ultrasonic waves reflected from the other side of the piled up structure, and diagnosing a damaged condition of the piled up structure on the basis of the ultrasonic velocity and attenuation of the received ultrasonic waves.
REFERENCES:
patent: 4777824 (1988-10-01), Alers et al.
patent: 5808202 (1998-09-01), Passarelli, Jr.
patent: 6038925 (2000-03-01), Ohtani et al.
patent: 6109108 (2000-08-01), Ohtani et al.
patent: 26 57 957 (1978-06-01), None
patent: 39 04 440 (1990-08-01), None
patent: 0 458 425 (1991-11-01), None
patent: 2 006 433 (1979-05-01), None
patent: 3052049 (1997-06-01), None
patent: 3052050 (1997-06-01), None
patent: 9-257760 (1997-10-01), None
M. Hirao et al., “Ultrasonic Attenuation Peak During Fatigue of Polycrystalline Copper,” inACTA MATER.48, pp. 517-524 (2000).
Ebara Corporation
Nghiem Michael
Westerman Hattori Daniels & Adrian LLP
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