Method and apparatus for determining within-die and...

Oscillators – Solid state active element oscillator – Transistors

Reexamination Certificate

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C331S057000, C331S185000, C702S065000, C702S071000, C702S075000, C702S079000, C702S118000, C702S179000

Reexamination Certificate

active

08031017

ABSTRACT:
Described herein is the method and apparatus for determining frequency of an oscillator coupled with one or more analog devices, and for determining within-die or across-die variations in an analog property associated with the one or more analog devices, the determining based on the oscillator frequency. The analog property includes output signal swing, bandwidth, offset, gain, and delay line linearity and range. The one or more analog devices include input-output (I/O) buffer, analog amplifier, and delay line. The method further comprises updating a simulation model file based on the determining of the within-die and/or across-die variations of the analog property.

REFERENCES:
patent: 6553545 (2003-04-01), Stinson et al.
patent: 7742887 (2010-06-01), Patel et al.
patent: 7760033 (2010-07-01), Podmanik et al.
Drake, Alan, et al., “A Distributed Critical-Path Monitor for a 65nm High-Performance Microprocessor”, ISSCC Dig. Tech. Papers, Feb. 2007, pp. 398-399.
Klass, Fabian , et al., “An All-Digital On-Chip Process-Control Monitor for Process-Variability Measurements”, 2008 IEEE International Solid-State Circuits Conference, ISSCC 2008, Session 22, Variation Compensation & Measurement, 22.5, (2008), pp. 408-409, 623.
Liang-Teck Pang, et al., “Measurements and Analysis of Process Variability in 90 nm CMOS”, IEEE Journal of Solid State Circuits, vol. 44, No. 5, May 2009, pp. 1655-1663.
Mukhopadhyay, Saibal, et al., “Statistical Characterization and On-Chip Measurement Methods for Local Random Variability of a Process Using Sense-Amplifier Based Test Structure”, ISSCC Dig. Tech. Papers, Feb. 2007, pp. 400-401.

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