Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate
2006-04-04
2006-04-04
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
For fault location
C324S424000, C324S539000
Reexamination Certificate
active
07023217
ABSTRACT:
According to one embodiment, the present invention provides a system for determining wear of an electrical element. The system includes a current source, a voltmeter and a control unit. The control unit is operable to couple the current source and the voltmeter to a first spare electrical element in a device under test, determine a characteristic physical property of the first spare electrical element and determine a wear characteristic for a primary electrical element in the device under test based upon the characteristic physical property of the first spare electrical element.
REFERENCES:
patent: 3988666 (1976-10-01), Rowland et al.
patent: 4160947 (1979-07-01), Tanno et al.
patent: 4477769 (1984-10-01), Lowery et al.
patent: 4700042 (1987-10-01), Ferrero et al.
patent: 4827121 (1989-05-01), Vidrine et al.
patent: 5015859 (1991-05-01), Uejio
patent: 5541509 (1996-07-01), Kyriakis
patent: 5982568 (1999-11-01), Yamamoto et al.
patent: 6017258 (2000-01-01), Sakurai et al.
patent: 6034531 (2000-03-01), Senglat et al.
patent: 6215315 (2001-04-01), Maejima et al.
patent: 6290027 (2001-09-01), Matsuzaki
patent: 6294912 (2001-09-01), Kwun
patent: 6361205 (2002-03-01), Andersen
patent: 6465949 (2002-10-01), Miahara et al.
patent: 6466023 (2002-10-01), Dougherty et al.
patent: 6483302 (2002-11-01), Rusnell et al.
patent: 6624577 (2003-09-01), Meszaros
patent: 6777948 (2004-08-01), Dominelli et al.
patent: WO 01/42802 (2001-06-01), None
patent: WO 01/55618 (2001-08-01), None
patent: WO 01/63976 (2001-08-01), None
patent: WO 01/69269 (2001-09-01), None
patent: WO 01/48117 (2001-11-01), None
patent: WO 02/086349 (2002-10-01), None
patent: WO 03/016890 (2003-02-01), None
patent: WO 2004/051293 (2004-06-01), None
patent: WO 04/070401 (2004-08-01), None
patent: WO 2004/075213 (2004-09-01), None
patent: WO 2004/088338 (2004-10-01), None
Hofstoetter, Peter, et al..,Application of the Potential Drop Method for In-Service Monitoring of Indications For Crack Initiation or Crack Propagation-Fundamental Priniciples And Practical Application, Transactions, SMiRT 16, Paper #1880, Washington DC, Aug. 2001.
Stander, Jennifer, et al.,Multiprobe Impedance Measurement System for Nondesctructive Evaluation and Test of “Green State” Power Metallurgy Parts, IEEE Transactions On Instrumentation and Measurement, vol. 47, No. 5, pp. 1367-71, Oct. 1998.
Cascio Schmoyer & Zervas
Honeywell International , Inc.
Miologos Anthony
Nguyen Hoai-An D.
Nguyen Vincent Q.
LandOfFree
Method and apparatus for determining wear of resistive and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for determining wear of resistive and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for determining wear of resistive and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3602407