Electricity: measuring and testing – Magnetic – With means to create magnetic field to test material
Reexamination Certificate
2003-07-22
2008-11-11
Patidar, Jay M (Department: 2862)
Electricity: measuring and testing
Magnetic
With means to create magnetic field to test material
C324S235000
Reexamination Certificate
active
07449881
ABSTRACT:
The invention provides a method and apparatus for monitoring subsurface chromium depletion from a steel member, such as a pyrolysis pipe. In the harsh conditions of a pyrolysis furnace, chromium within the pipe16migrates towards the pipe surface which results in the formation of a chromium depleted layer14. This layer can provide useful data about the condition and operation of the furnace. The degree of chromium depletion is measured by using a magnetic source of known strength to create a magnetic field in the surface region of the pipe16. An estimate of the thickness of the chromium depleted layer14is determined from the resultant magnetic flux, which can be measured by a hall element arranged at substantially 45° to the longitudinal axis of the magnet.
REFERENCES:
patent: 3359495 (1967-12-01), McMaster et al.
patent: 3440527 (1969-04-01), Steingroever
patent: 3689828 (1972-09-01), Kurose et al.
patent: 3761804 (1973-09-01), Steingroever
patent: 4931730 (1990-06-01), Olsen et al.
patent: 5105151 (1992-04-01), Takahashi et al.
patent: 5128613 (1992-07-01), Takashi
patent: 5343146 (1994-08-01), Koch
patent: 5828212 (1998-10-01), Nix
patent: 6051972 (2000-04-01), Bour et al.
patent: 19543362 (1995-11-01), None
patent: 0028487 (1981-05-01), None
patent: 2271641 (1993-09-01), None
patent: 2306006 (1996-09-01), None
patent: 302202 (1996-05-01), None
patent: 1375942 (1986-02-01), None
Takashi et al., Study of chromium depletion by magnetic method in Ni-based alloys, Feb. 2004, Journal of Magnetism and Magnetic material, vol. 269, Issue 2, pp. 139-149.
Arnesen Tore
Edwin Emil
Ballard Spahr Andrews & Ingersoll LLP
Borealis Technology Oy
Patidar Jay M
LandOfFree
Method and apparatus for determining the thickness of a... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for determining the thickness of a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for determining the thickness of a... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4024593