Method and apparatus for determining the position of a feature o

Details Method and apparatus for determining the position of a feature o Method and apparatus for determining the position of a feature o

1986-06-03

1988-05-17

Evans, F. L.

Optics: measuring and testing

By polarized light examination

With light attenuation

358101, 356376, G01B 1100

Patent

active

047446641

ABSTRACT:
A system for locating a feature of an object disposed in a frame includes a spot projector for projecting a spot in the general vicinity of the feature and an imaging device with a limited field of view. The spot projector is a precision device which projects the spot towards a preselected location on the frame. When the spot and the feature are in the field of view of the imaging device, the absolute location of the feature is determined from its selective distance to the spot. Provisions are also made for determining depth or relief information about the object.

REFERENCES:
patent: 4136957 (1979-01-01), Uno et al.
patent: 4508452 (1985-04-01), Di Matteo et al.

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