Optics: measuring and testing – By polarized light examination – With polariscopes
Reexamination Certificate
2005-02-15
2005-02-15
Lauchman, Layla (Department: 2877)
Optics: measuring and testing
By polarized light examination
With polariscopes
C356S368000, C356S369000, C250S225000
Reexamination Certificate
active
06856391
ABSTRACT:
The invention relates to a method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope with the tested material being illuminated point by point with a laser beam of known polarization state. According to the invention the light beam with a polarization state modified by the material or the light emitted by the material is being examined by measuring the intensity of two different polarization components of a selected light beam received from each point of said material essentially at the same time and assigning a signal obtained by processing the two intensity signals to a respective point of an image of said material. The apparatus has a polarization state generator between the laser light source and the material being tested, and a detector in a light beam for determining the intensity of light with a polarization state modified by the material or the intensity of light emitted by the material, the improvement of which is that a means for dividing the polarization components in space or time is used in front of the detector.
REFERENCES:
patent: 4306809 (1981-12-01), Azzam
patent: 5257092 (1993-10-01), Noguchi et al.
patent: 5389783 (1995-02-01), Shionoya et al.
patent: 5457536 (1995-10-01), Kornfield et al.
patent: 5764363 (1998-06-01), Ooki et al.
patent: 5965874 (1999-10-01), Aso et al.
patent: 6025917 (2000-02-01), Toyonaga et al.
patent: 6097488 (2000-08-01), Grek et al.
patent: 6134011 (2000-10-01), Klein et al.
patent: 6175412 (2001-01-01), Drevillon et al.
patent: 6356036 (2002-03-01), Zhou
patent: 6384916 (2002-05-01), Furtak et al.
patent: 6515745 (2003-02-01), Vurens et al.
patent: 11-095114 (1999-04-01), None
Nielsen P. M. F. et al., “Polarization-sensitive scanned fiber confocal microscope,”Optical Engineering, vol. 35, No. 11, pp. 3084-3091 (Nov., 1996).
Garab Gyózó
Jörgens Reinhard
Pomozi István
Weiss Georg
Lauchman Layla
Morgan & Lewis & Bockius, LLP
LandOfFree
Method and apparatus for determining the polarization... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for determining the polarization..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for determining the polarization... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3460053