Method and apparatus for determining the low temperature charact

Details Method and apparatus for determining the low temperature charact Method and apparatus for determining the low temperature charact

1980-02-29

1982-05-04

Gill, James J.

Thermal measuring and testing

Differential thermal analysis

324 65R, 374 21, G01N 2504, G01N 2714

Patent

active

043275737

ABSTRACT:
A method and apparatus for determining the low temperature characteristics of materials measures the resistivity of a sample material and the resistivity of a comparision material and plots the ratio of the resistivity of the comparision material to the resistivity of the sample material versus the temperature of the sample material. In addition, the method and apparatus measures the temperature of the sample and the temperature of a reference material and plots the difference there between as a function of the temperature of the reference material. The method and apparatus is usable in monitoring and/or controlling lyophilization appartus in order to increase the efficiency of the freeze drying process, that is, increasing product yield while reducing processing time.

REFERENCES:
patent: 2769072 (1956-10-01), Obenshain
patent: 3078586 (1963-02-01), Rey
patent: 3209249 (1965-09-01), Warfield
patent: 3572084 (1969-01-01), May
patent: 3875788 (1975-04-01), Mills
patent: 3888107 (1975-06-01), Langer et al.
patent: 4154085 (1979-05-01), Hentze

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