Optics: measuring and testing – Crystal or gem examination
Patent
1994-10-13
1995-06-13
Evans, F. L.
Optics: measuring and testing
Crystal or gem examination
356154, G01N 2187, G01B 1126
Patent
active
054248302
ABSTRACT:
A method and apparatus for determining the facet angles of a gemstone includes structure for rotatably mounting a gemstone along the optical axis of the gemstone. A collimated beam of light is directed toward a facet of the gemstone, such that the facet reflects light. A scale is mounted parallel to and spaced apart from the gemstone optical axis. The scale includes indicia indicating angular measurements, such that the facet reflected light impinges on the scale. The location of the facet reflected light on the scale indicia indicates the angle of the facet.
REFERENCES:
patent: 1700496 (1929-01-01), Heitzler
patent: 1700497 (1929-01-01), Heitzler
patent: 1799604 (1931-04-01), Read
patent: 3751162 (1973-08-01), Long
patent: 3782836 (1974-01-01), Fey et al.
patent: 3858979 (1975-01-01), Elbe
patent: 4065211 (1977-12-01), Vig
LandOfFree
Method and apparatus for determining the facet angles of a gemst does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for determining the facet angles of a gemst, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for determining the facet angles of a gemst will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1314155