Method and apparatus for determining the emissivity, area...

Details Method and apparatus for determining the emissivity, area... Method and apparatus for determining the emissivity, area...

2007-12-06

2011-11-01

Moffat, Jonathan Teixeira (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Temperature measuring system

C702S136000, C356S043000, C374S009000

Reexamination Certificate

active

08050884

ABSTRACT:
Methods and apparatus are provided to determine the emissivity, temperature and area of an object. The methods and apparatus are designed such that the emissivity and area of the object may be separately determined as functions dependent upon the temperature of the object derived from a three or more band infrared measurement sensor. As such, the methods and apparatus may only require a regression analysis of the temperature of the object without any regression analysis of the emissivity and area of the object.

REFERENCES:
patent: 5021980 (1991-06-01), Poenisch et al.
patent: 5153563 (1992-10-01), Goto et al.
patent: 5231595 (1993-07-01), Makino et al.
patent: 2005/0045825 (2005-03-01), Murata
patent: 2010/0100352 (2010-04-01), Thro et al.
patent: WO 2007/093744 (2007-08-01), None
Spitzberg, R.M., “Tutorial on Target Phenomenology and Optical Discrimination for Midcourse Sensors”; MIT Lincoln Laboratory; NMD Discrimination Working Group; Nov. 14, 2001.
“Mosaic Signal Processing in Nuclear Environments (U)”; Final Technical Report; Oct. 1984; Prepared for: The Ballistic Missile Defense; Advanced Technology Center; Huntsville, Alabama; Contract Monitor: F.M. Hoke.

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