Method and apparatus for determining the dielectric constant of

Details Method and apparatus for determining the dielectric constant of Method and apparatus for determining the dielectric constant of

1986-11-10

1988-06-28

Pellinen, A. D.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Frequency of cyclic current or voltage

324 585R, G01R 2706

Patent

active

047542144

ABSTRACT:
A method and an apparatus for determining the dielectric constant of a material wherein the material is loaded to a short-circuited microstrip and microwaves are fed to the microstrip for providing a reflected signal. The reflected signal is compared with a reference signal both under load and not load conditions of the microstrip for obtaining the modulus and the phase of the reflection coefficient, the dielectric constant being a function thereof. The measure of the phase angle between the reference and the reflected signal in both conditions is obtained by handling the reflected signal with a first phase shifter and a second calibrated phase shifter cooperating with a zero detector. The method and the apparatus of the invention is especially designed for a quick and easy measure of the amount of unburnt coal in the ash coming from a combustion heater.

REFERENCES:
patent: 3025463 (1962-03-01), Luoma et al.
patent: 3701943 (1972-10-01), Kaiser
patent: 4104584 (1978-08-01), Miyai et al.
patent: 4345202 (1982-08-01), Nagy et al.
Bahl, et al., "Analysis of a Microstrip Covered with a Lossy Dielectric", IEEE Trans. Microwave Theory and Tech., vol. MTT 28, No. 2, pp. 104-109, Feb. 1980.
Hitchin et al., "Rapid Method Suitable for Liquids and Powders for Determination of Relative Permittivities in the Microwave Region", Electronics Letters, vol. 9, No. 2, 1/25/73, pp. 39-40.
Everett et al., "A Computer-Controlled Dielectric Constant Measurement System: The Moving Vane Dielectometer", 1982 IEEE MTT-S International Microwave Symposium Digest, Dallas, Tex., 15th-17th Jun. 1982, pp. 325-327.
Musil et al., "New Microwave System to Determine the Complex Permittivity of Small Dielectric and Semiconducting Samples", 10th-13th Sept. 1974, pp. 66-70.

Affiliated with

Also associated with

Rating

Method and apparatus for determining the dielectric constant of does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for determining the dielectric constant of , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for determining the dielectric constant of will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1917142