Method and apparatus for determining the average size of apertur

Details Method and apparatus for determining the average size of apertur Method and apparatus for determining the average size of apertur

1974-10-04

1976-05-04

Borchelt, Archie R.

Radiant energy

Photocells; circuits and apparatus

Interference pattern analysis

250572, 356102, G02B 2738

Patent

active

039550958

ABSTRACT:
The average aperture width in a small area of an apertured member, such as a shadow mask for a cathode ray tube, is determined by passing a beam of substantially monochromatic light through an area of the member to form an interference pattern, detecting the intensities of at least two light fringes of the interference pattern, generating electrical signals which are representative of the detected intensities and then deriving the average width of apertures in the lit area of the members from the generated signals.

REFERENCES:
patent: 3518007 (1970-06-01), Ito et al.
patent: 3643101 (1972-02-01), Shipp et al.
patent: 3664739 (1972-05-01), Pryor
patent: 3814943 (1974-06-01), Baker et al.
patent: 3851180 (1974-11-01), Kato et al.

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