Method and apparatus for determining symmetry in 2d and 3d...

Details Method and apparatus for determining symmetry in 2d and 3d... Method and apparatus for determining symmetry in 2d and 3d...

2002-01-18

2008-08-05

Alavi, Amir (Department: 2624)

Image analysis

Histogram processing

For segmenting an image

C382S293000

Reexamination Certificate

active

07409085

ABSTRACT:
A method of determining symmetry in an image, a method of determining a symmetry plane line segment of a 3D image, a method of determining a symmetry line of a 2D image, and a computer program product. The method includes a) determining at least one searching line segment within a predefined search area of an image portion, the at least one searching line segment including a reference point (x, y) at its center and an angle θ with respect to a predetermined axis of the image portion; b) for each searching line segment, determining a first local characteristic in accordance with a measurement at points adjacent the searching line segment; c) determining the symmetry in the image in accordance with a calculation based on the first local characteristic.

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Notification Of Transmittal Of International Preliminary Report (Form PCT/IPEA/416) On Patentability mailed on Jun. 11, 2004, including PCT International Preliminary Examination Report (Form PCT/IPEA/409) for International Application No. PCT/SG 2002/000006, 7 pgs.

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