Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science
Patent
1998-03-31
2000-07-18
McElheny, Jr., Donald E.
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Earth science
G01V 326
Patent
active
060920246
ABSTRACT:
An apparatus and a method for determining the conductivity and dielectric constants of an anisotropic formation uses a redundant set of electromagnetic measurements in combination with anisotropic formation models that relate the anisotropic conductivity and dielectric constant of the formation to measurements of a propagating electromagnetic wave in the formation. A conjugate gradient scheme or a Newton-Raphson algorithm is used to obtain solutions to the nonlinear equations of propagation. The solutions to the equations are usually non-unique and are also susceptible to measurement errors. Use of redundant measurements makes it possible to resolve the non-uniqueness. The redundancy is obtained by using multiple frequency and/or multiple spacing tools. The use of redundant measurements also makes it possible to reduce the error in the solution of the wave propagation equation.
REFERENCES:
patent: 5329448 (1994-07-01), Rosthal
patent: 5656930 (1997-08-01), Hagiwara
patent: 5811973 (1998-09-01), Meyer, Jr.
patent: 5869968 (1999-02-01), Brooks et al.
patent: 5886526 (1999-03-01), Wu
"Effects of Formation Anisotropy on Resistivity-Logging Measurements", J.H. Moran and S. Gianzero, Society of Explortion Geophysicists, 1979, pp. 1266-1286.
"Response of 2-MHz LWD Resistivity and Wireline Inductrion Tool in Dipping Beds and Laminated Formations", Barbara Anderson, Stephen Bonner, Martin G. Luling and Richard Rosthal, SPWLA 31.sup.st Annual Logging Symposium, Jun. 24-27, 1990.
"Effects of Eccentering MWD Tools on Electromagnetic Resistivity Measurements", Jian-qun Wu, and Macmillan M. Wisler, SPWLA 35.sup.st Annual Logging Symposium, Jun. 24-27, 1990.
"The Effects of Rock Anisotropy on MWD Electromagnetic Wave Resistivity Sensors", Michael S. Bittar, Paul F. Rodney, SPWLA 35.sup.th Annual Logging Symposium, Jun. 19-22, 1994.
Processing and Modeling 2-MHz Resistivity Tools in Dipping, Laminated, Anistotropic Formations, Martin G. Luling, Richard A. Rosthal, Frank Shray, SPWLA 35.sup.th Annual Logging Symposium, Jun. 19-22, 1994.
"A New Method to Determine Horizontal-Resistivity in Anisotrophi Formations without Prior Knowledge of Relative Dip", T. Hagiwara, SPWLA 37.sup.th Annual Logging Symposium, Jun. 16-9, 1996.
Baker Hughes Incorporated
McElheny Jr. Donald E.
LandOfFree
Method and apparatus for determining resistivity and dielectric does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for determining resistivity and dielectric , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for determining resistivity and dielectric will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2047352