Thermal measuring and testing – Distance or angle – Thickness – erosion – or deposition
Patent
1982-09-23
1985-01-29
Yasich, Daniel M.
Thermal measuring and testing
Distance or angle
Thickness, erosion, or deposition
73204, 422 88, 436 37, G01K 1706, G01K 2522
Patent
active
044962495
ABSTRACT:
A method of determining the proportion of the surface area of a coated substrate that is covered by the coating comprising passing a known volume of an adsorbate gas under controlled flow conditions over a coated substrate and measuring the volume of adsorbate gas adsorbed on the surface area at different temperatures between the liquefaction temperature of the adsorbate gas and ambient temperature; similarly measuring the volume of the adsorbate gas adsorbed on the surface area of the substrate in the absence of the coating in the same temperature range; similarly measuring the volume of the adsorbate gas adsorbed on said coating in the absence of said substrate in the same temperature range; comparing the above volumes at identical temperatures and calculating therefrom the proportion of surface area of said substrate covered by said coating; and an apparatus for practicing said method. This method in this apparatus is especially useful in measuring the surface area of catalytic material on a supported catalyst.
REFERENCES:
patent: 3124952 (1964-03-01), Johnson
patent: 3149941 (1964-09-01), Barnitz et al.
patent: 3467501 (1969-09-01), Groszek
patent: 3567388 (1971-03-01), Kapff
patent: 3598534 (1971-08-01), Templer
patent: 3841155 (1974-10-01), Koehler et al.
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patent: 4246228 (1981-01-01), Jones et al.
"Automatic Apparatus for Catalyst Characterization by Temp.-Programmed Reduction/Desorption/Oxidation", Boer et al., pp. 349-361 of Rev. Sci. Instrum. 53, Mar. '82.
Lee Hong H.
Miller Dennis J.
University of Florida
Yasich Daniel M.
Yeager Arthur G.
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