Method and apparatus for determining regional dip properties

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science

Reexamination Certificate

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Reexamination Certificate

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06856910

ABSTRACT:
A method for determining a formation dip angle including extracting features from an acquired well log to obtain a set of features, validating the set of features to obtain a subset of features, generating a layered model using the subset of features, and generating a synthetic log using the layered model and a forward model.

REFERENCES:
patent: 4764904 (1988-08-01), Salomonsen et al.
patent: 4800539 (1989-01-01), Corn et al.
patent: 4953142 (1990-08-01), Rimmer
patent: 4962490 (1990-10-01), Lyle et al.
patent: 4984220 (1991-01-01), Bodine et al.
patent: 5210691 (1993-05-01), Freedman et al.
patent: 5432751 (1995-07-01), Hildebrand
patent: 5570106 (1996-10-01), Viswanathan
patent: 5867806 (1999-02-01), Strickland et al.
patent: 5983163 (1999-11-01), Waid et al.
patent: 6278949 (2001-08-01), Alam
patent: 6393364 (2002-05-01), Gao et al.

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