Method and apparatus for determining particle parameter and...

Details Method and apparatus for determining particle parameter and... Method and apparatus for determining particle parameter and...

2004-05-20

2009-06-02

Nghiem, Michael P (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Performance or efficiency evaluation

Reexamination Certificate

active

07542873

ABSTRACT:
An image (100) of particulate material, such as an X-ray image of coal, is captured and processed to determine a parameter of the material, such as particle density or particle size distribution. The performance or efficiency of a processing system, such as a dense medium separator, can be evaluated by determining parameters of the material before entry to and after exit from the processing system. The parameter is determined by comparing image characteristics (relating to statistical features), to a predetermined set of image characteristics. If the image (100) is obtained by transmission of radiation through the material, accuracy can be improved by measuring the thickness of the material.

REFERENCES:
patent: 4226714 (1980-10-01), Furness et al.
patent: 4470901 (1984-09-01), Burgess
patent: 4731176 (1988-03-01), Macdonald
patent: 5519793 (1996-05-01), Grannes
patent: 6212943 (2001-04-01), Maltby et al.
patent: 6513124 (2003-01-01), Furuichi et al.
patent: 2004/0066890 (2004-04-01), Dalmijn et al.
patent: 2006/0196814 (2006-09-01), Vince
patent: 19751591 (1999-09-01), None
patent: 0 226 430 (1986-09-01), None
patent: 2075867 (1981-11-01), None
patent: 2188752 (1987-10-01), None
patent: 05-230463 (1993-09-01), None
patent: 09-264851 (1997-10-01), None
patent: 2000-329683 (2000-11-01), None
patent: 2149379 (2000-05-01), None
patent: WO 97/14950 (1997-04-01), None
patent: WO 02/50521 (2002-06-01), None
patent: WO 2004/062809 (2004-07-01), None
Derwent Abstract, DE 19751591, Sep. 1999.

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