Method and apparatus for determining oxide film thickness

Details Method and apparatus for determining oxide film thickness Method and apparatus for determining oxide film thickness

1982-06-25

1985-01-22

Krass, Errol A.

Boots, shoes, and leggings

118712, 204 1T, 364481, 364496, 427 10, G01B 1302, B01D 5940, C25F 500

Patent

active

044955588

ABSTRACT:
Thickness of an electrically insulative metal oxide film deposited on an electrically conductive metal substrate is determined by electrolytically reducing the metal oxide in an electrochemical cell while continuously measuring the cell voltage. A mathematical relationship between the cell voltage change and elapsed time of electrolytic reduction serves as a means for determining thickness of said oxide coating. This method and apparatus is particularly suitable for measurement of the oxide coating thickness on a metal wire substrate.

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Pops, et al., The Role of Surface Oxide and its Measurement in the Copper Wire Industry, Wire Journal, Mar. 19, 1977.
P. Seddon, Tin Coatings on Copper Wires-Determination of Thickness by an Electrolytic Method, The Metal Industry, Jan. 15, 1943.

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