Method and apparatus for determining index of refraction profile

Optics: measuring and testing – For optical fiber or waveguide inspection

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356128, G01N 2184, G01N 2141

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active

044681186

ABSTRACT:
A photoconductor having a passageway therethrough is employed in practicing the refractive near-field method of determining the index of refraction profile of an optical fiber as a technique of eliminating leaky mode contribution to detected power.

REFERENCES:
patent: 2963938 (1960-12-01), Irland et al.
patent: 3705771 (1972-12-01), Friedman et al.
patent: 4021099 (1977-05-01), Kawasaki et al.
patent: 4197007 (1980-04-01), Costa et al.
"Precise Mesurement of the Refractive Index Profile of Optical Fibers by a Non-destructive Interference Method," Kokubun et al., Transactions of the IECE of Japan, Vol. E-60, No. 12, Dec. 1977, pp. 702-707.
"Optical Fiber Profiles Using the Refracted Near-Field Technique; A Comparison with Other Methods," Saunders, Applied Optics, vol. 20, No. 9, pp. 1645-1651, May 1, 1981.
"Mach-Zender Interferometer Data Reduction Method for Refractively in Homogenous Test Obejcts, Hunter et al., Applied Optics, vol. 14, No. 3 (Mar. 1975) pp. 634-639.
"Non-Destructive Refractive-indes Profile Measurements of Clad Optical Fibers", Marhic et al., Applied Physics Letters, vol. 26, No. 10, May 15, 1975, pp. 574-575.
"Mode Transit Times in Near-Parabolic-Index Optical Fibers" Adams et al., Electronic Letters, vol. 11, #16, Aug. 1975, pp. 389-391.
"Determination of Optical Fiber Refractive Index Profile by a Near-Field Scanning Technique", Slader et al., Applied Physics Letters, vol. 28, No. 5, Mar. 1, 1976, pp. 255-258.
"A New Technique for Measuring the Refractive Index Profiles of Graded Optical Fibers", Steward, Proc. of the Conference on Integrated Optics & Optical Communication, Japan 1977, pp. 395-98.
"Refractive Index Profile Measurement of Optical Fibers by the Refracted Near-Field Technique," Quantum Electronics, White, 3-79.
"Refracted Power Technique for Cutoff Wavelength Measurement in Single-Mode Waveguides", Bhagavatula et al., Electronic Letters, Aug. 28, 1980, vol. 16, No. 18, pp. 695-696.

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