Method and apparatus for determining embedded runout...

Details Method and apparatus for determining embedded runout... Method and apparatus for determining embedded runout...

2006-09-12

2006-09-12

Wong, Kim (Department: 2627)

Dynamic magnetic information storage or retrieval

Automatic control of a recorder mechanism

Controlling the head

Reexamination Certificate

active

07106547

ABSTRACT:
A method and apparatus for determining embedded runout correction values uses a closed-loop system (with feedback) in a disk drive. Optionally, the embedded runout correction values may be determined after the disk drive has been manufactured and placed in the field. In addition, the embedded runout correction values may be updated after the disk drive has been manufactured and placed in the field.

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patent: 6549362 (2003-04-01), Melrose et al.
patent: 6657810 (2003-12-01), Kupferman
patent: 6804079 (2004-10-01), Hsin
Hargarten, et al., U.S. Appl. No. 10/029,528, filed Dec. 20, 2001, “Method and Apparatus for Automatically Determining an Embedded Runout Correction Threshold”.

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