Method and apparatus for determining electrical properties...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

10949944

ABSTRACT:
A method and apparatus for determining an electrical property of a structure. The method involves creating a model of an electrical property of a structure and measuring the electrical property of the structure between at least two of a plurality of locations. The method also involves determining the electrical property of at least a portion of the structure based on the model and the measurement of the electrical property between the at least two of the plurality of locations.

REFERENCES:
patent: 3552856 (1971-01-01), Schwallie
patent: 3789657 (1974-02-01), Ching, Jr. et al.
patent: 4142405 (1979-03-01), Stevens
patent: 4292851 (1981-10-01), Brewer
patent: 4429580 (1984-02-01), Testa et al.
patent: 4482784 (1984-11-01), Whetstone
patent: 4514688 (1985-04-01), Whetstone
patent: 4637263 (1987-01-01), Fritz et al.
patent: 4689448 (1987-08-01), Snyder et al.
patent: 4744252 (1988-05-01), Stout
patent: 4869113 (1989-09-01), Sarrazin
patent: 4901575 (1990-02-01), Bohannan et al.
patent: 4956999 (1990-09-01), Bohannan et al.
patent: 5125017 (1992-06-01), Lempriere
patent: 5184516 (1993-02-01), Blazic et al.
patent: 5195046 (1993-03-01), Gerardi et al.
patent: 5255565 (1993-10-01), Judd et al.
patent: 5375471 (1994-12-01), Blazic et al.
patent: 5383133 (1995-01-01), Staple
patent: 5525853 (1996-06-01), Nye et al.
patent: 5549803 (1996-08-01), Schoess et al.
patent: 5559358 (1996-09-01), Burns et al.
patent: 5636021 (1997-06-01), Udd
patent: 5650570 (1997-07-01), Goto et al.
patent: 5723792 (1998-03-01), Miyazaki
patent: 5723857 (1998-03-01), Underwood et al.
patent: 5774376 (1998-06-01), Manning
patent: 5841034 (1998-11-01), Ball
patent: 5911158 (1999-06-01), Henderson et al.
patent: 5936411 (1999-08-01), Jacobsen et al.
patent: 5970393 (1999-10-01), Khorrami et al.
patent: 6006163 (1999-12-01), Lichtenwalner et al.
patent: 6014896 (2000-01-01), Schoess
patent: 6069985 (2000-05-01), Albin et al.
patent: 6076405 (2000-06-01), Schoess
patent: 6079277 (2000-06-01), Chung
patent: 6080982 (2000-06-01), Cohen
patent: 6109115 (2000-08-01), Miyazaki
patent: 6144026 (2000-11-01), Udd et al.
patent: 6148675 (2000-11-01), Okano
patent: 6191519 (2001-02-01), Nye et al.
patent: 6192759 (2001-02-01), Schoess
patent: 6252334 (2001-06-01), Nye et al.
patent: 6256090 (2001-07-01), Chen et al.
patent: 6370964 (2002-04-01), Chang et al.
patent: 6396262 (2002-05-01), Light et al.
patent: 6399939 (2002-06-01), Sundaresan et al.
patent: 6480792 (2002-11-01), Prendergast
patent: 6529127 (2003-03-01), Townsend et al.
patent: 6547448 (2003-04-01), Johnson et al.
patent: 6617963 (2003-09-01), Watters et al.
patent: 6625569 (2003-09-01), James et al.
patent: 6668105 (2003-12-01), Chen et al.
patent: 6674928 (2004-01-01), Johnson et al.
patent: 6693548 (2004-02-01), Boyce et al.
patent: 2002/0107679 (2002-08-01), Roelofs

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for determining electrical properties... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for determining electrical properties..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for determining electrical properties... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3731372

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.