Method and apparatus for determining defectiveness/non-defective

Details Method and apparatus for determining defectiveness/non-defective Method and apparatus for determining defectiveness/non-defective

1995-06-22

2000-03-28

Pham, Hoa Q.

Optics: measuring and testing

Lamp beam direction or pattern

372 29, 3241581, G01J 100

Patent

active

06043872&

ABSTRACT:
A driving current is supplied to a semiconductor laser and an optical output from the semiconductor laser is measured by an optical output measuring circuit. The measured optical output is differentiated with respect to said driving current and a first characteristic data indicative of a relation of the differentiated optical output and the driving current is calculated by a first differentiating circuit. The calculated first characteristic data is differentiated with respect to the driving current and a second characteristic data indicative of a relation of the secondary differentiated optical output and said driving current is calculated. The calculated second characteristic data is converted into a determination code. The converted determination code is compared with a preregistered code for determining the defectiveness
on-defectiveness of a semiconductor laser and it is determined based on the comparing result the defectiveness or non-defectiveness of the semiconductor laser.

REFERENCES:
patent: 4062632 (1977-12-01), Dixon
patent: 4106096 (1978-08-01), Paoli
patent: 4604753 (1986-08-01), Sawai
patent: 4680810 (1987-07-01), Swartz
patent: 4684883 (1987-08-01), Ackerman et al.
patent: 4795976 (1989-01-01), Pawlik
patent: 4827116 (1989-05-01), Takagi et al.

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