Data processing: measuring – calibrating – or testing – Measurement system – History logging or time stamping
Reexamination Certificate
2006-03-28
2006-03-28
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
History logging or time stamping
C438S014000
Reexamination Certificate
active
07020583
ABSTRACT:
An electronic monitoring device that archives chemical exposures of a consumable part inside a semiconductor processing tool. The monitoring device includes a memory unit dedicated to the consumable part and which stores a history of the chemical exposures of the consumable part, a processor in communication with the memory unit, and a power supply circuit that supplies power to the processor and the memory unit.
REFERENCES:
patent: 5457447 (1995-10-01), Ghaem et al.
patent: 5495250 (1996-02-01), Ghaem et al.
patent: 6185513 (2001-02-01), Plettner et al.
patent: 6691068 (2004-02-01), Freed et al.
patent: 2003/0036885 (2003-02-01), Suermondt et al.
patent: 2003/0113943 (2003-06-01), Kishkovich et al.
patent: 2004/0040658 (2004-03-01), Usui et al.
patent: 2005/0107965 (2005-05-01), Kerr et al.
Calabrese Paula
Mitrovic Andrej
Hoff Marc S.
Kim Paul
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Tokyo Electron Limited
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