Optics: measuring and testing – For size of particles
Reexamination Certificate
2006-07-17
2009-06-02
Pham, Hoa Q (Department: 2886)
Optics: measuring and testing
For size of particles
Reexamination Certificate
active
07542139
ABSTRACT:
A system for determining a parameter of interest of at least one particle in a sample of a fluid obtained from a formation, comprises a view cell containing at least a portion of the sample and at least one window for viewing the sample. A light source illuminates the sample. An imaging system captures at least one image of the illuminated sample. A program executing a set of instructions on a computer analyzes the at least one image and generates an output related to at least one parameter of interest of the at least one particle in said sample.
REFERENCES:
patent: 4606631 (1986-08-01), Anno et al.
patent: 4747685 (1988-05-01), Suzuki
patent: 5134445 (1992-07-01), Toge
patent: 5420040 (1995-05-01), Anfindsen et al.
patent: 5969237 (1999-10-01), Jones et al.
patent: 6049381 (2000-04-01), Reintjes et al.
patent: 6087662 (2000-07-01), Wilt et al.
patent: 6091502 (2000-07-01), Weigl et al.
patent: 6501072 (2002-12-01), Mullins et al.
patent: 7242474 (2007-07-01), Cox et al.
patent: 2003/0033866 (2003-02-01), Diakonov et al.
patent: 2003/0064505 (2003-04-01), Harttig
patent: 2 371 858 (2002-08-01), None
patent: WO 99/51963 (1999-10-01), None
patent: WO 00/46586 (2000-08-01), None
Core Laboratories LP
Mossman Kumar & Tyler PC
Pham Hoa Q
LandOfFree
Method and apparatus for determining characteristics of... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for determining characteristics of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for determining characteristics of... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4073440