Method and apparatus for determining a bidirectional...

Details Method and apparatus for determining a bidirectional... Method and apparatus for determining a bidirectional...

2007-03-13

2007-03-13

Lee, Hwa (Andrew) (Department: 2877)

Optics: measuring and testing

Of light reflection

With diffusion

C356S445000

Reexamination Certificate

active

10858665

ABSTRACT:
An apparatus for determining a bidirectional reflectance distribution function of a subject. In one embodiment, the apparatus includes a light source for producing light. The apparatus includes means for measuring the bidirectional reflectance distribution function of the subject from multiple locations simultaneously with the light. A method for determining a bidirectional reflectance distribution function of a subject.

REFERENCES:
patent: 5637873 (1997-06-01), Davis et al.
patent: 6122042 (2000-09-01), Wunderman et al.
patent: 10143602 (2003-04-01), None
U.S. Appl. No. 10/620,920.
U.S. Appl. No. 10/665,804.

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