Method and apparatus for determination of the depth of...

Measuring and testing – Surface and cutting edge testing – Roughness

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C073S104000, C073S866000

Reexamination Certificate

active

07152461

ABSTRACT:
The invention relates to a method for determination of the depth of depressions which are formed in a mount substrate. According to the invention, an essentially uniform layer of a wetting agent is applied, which contains depressions, on a surface of the mount substrate, a time profile of the decrease in weight of the mount substrate is recorded, and the recorded time profile of the decrease in weight of the mount substrate is evaluated. The invention also relates to a measurement apparatus.

REFERENCES:
patent: 3605501 (1971-09-01), Chenevert
patent: 5321634 (1994-06-01), Obata et al.
patent: 5625170 (1997-04-01), Poris
patent: 6194234 (2001-02-01), Huang et al.
patent: 6284986 (2001-09-01), Dietze et al.
patent: 6306545 (2001-10-01), Carlson et al.
patent: 6684685 (2004-02-01), Gupta et al.
patent: 6708559 (2004-03-01), Chen et al.
patent: 7020577 (2006-03-01), Wilby
patent: 2003/0061890 (2003-04-01), Chen et al.
patent: WO-02/03449 (2002-01-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for determination of the depth of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for determination of the depth of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for determination of the depth of... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3671320

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.