Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2006-11-08
2011-11-01
Lee, Hwa (Department: 2886)
Optics: measuring and testing
By light interference
For dimensional measurement
Reexamination Certificate
active
08049899
ABSTRACT:
A Michelson-interferometer which has two reference arms and a short coherence length is used for the method and apparatus for measurement of geometric values on transparent or diffuse objects (19). The basic optical delay times of the reference arms (11, 12) are chosen in such a manner that they result in an optical delay time difference corresponding to a layer thickness, as a geometric value. The at least two reference arm beams (33a, 35a) are passed to a single rotating path-length variation element (23), with a mutual spatial offset angle (dw). A delay-time change, which is dependent on the rotation angle, of the reference arm beams is produced as a function of a rotation angle caused by rotation, in order to allow a delay-time change caused by the path-length variation element (23) to be applied successively to the basic optical delay times in the reference arms (11, 12). A topography as a further geometric value is obtained by projection of a light-intensity structure onto a surface to be measured, and by measurement of its image.
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Breitenstein Jörg
Buri Urs
Waelti Rudolf
Birch & Stewart Kolasch & Birch, LLP
Haag-Streit AG
Lee Hwa
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