Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1994-09-01
1996-05-07
Pham, Hoa Q.
Optics: measuring and testing
By particle light scattering
With photocell detection
356339, 356369, G01N 2100
Patent
active
055151639
ABSTRACT:
A method and an apparatus for the analysis of particles contained in a material, such as particles in a fluid or on a surface, such as the surface of a semiconductor, by two orthogonally polarized, intensity and phase modulated laser beams, wherein the detected scattered light is synchronously demodulated. The apparatus comprises a laser source producing a polarized laser beam, a state of polarization modulator, and a photoreceiver for detecting light scattered by particles at an angle to the incident light. A synchronous demodulator, such as a dual channel lock-in amplifier, separates the intensity and phase modulated portions of the scattered signals. A reference unit for detecting a non-scattered light produced by the sample to provide a reference is preferably provided, as well. The size, index of refraction and identity, of the particles, for example, can be determined.
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Kouchnir Mikhail
Kupershmidt Vladimir
Pham Hoa Q.
Sunshine Medical Instruments, Inc.
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