Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-10-17
2010-12-28
Chang, Jon (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C356S035500, C356S237200
Reexamination Certificate
active
07860297
ABSTRACT:
In a method for detecting the deformation of objects (1), a sequence of pictures of the object (1) is taken with a measurement method during the deformation of the object (1). From the pictures, phase images are determined. To improve such method, there is formed the difference between the current phase image or the respective current phase image and the phase image of an initial state. This difference or these differences is/are evaluated and/or displayed on a visual display unit and/or stored.
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patent: 2002/0135751 (2002-09-01), Steinbichler et al.
Huber Rainer
Rasenberger Volker
Steinbichler Marcus
Sun Juni
Wilhelm Robert
Chang Jon
Dilworth & Barrese LLP
Steinbichler Optotechnik GmbH
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