Optics: measuring and testing – By polarized light examination – With birefringent element
Patent
1989-12-20
1991-10-29
Turner, Samuel
Optics: measuring and testing
By polarized light examination
With birefringent element
356349, 356358, 2502014, G01B 902
Patent
active
050610716
ABSTRACT:
Method and apparatus for detecting the roughness or undulation of a subject surface, by using a light beam which is converged on the subject surface by an object lens and which is reflected by the subject surface. A relative position between the object lens and the subject surface in the direction parallel to the optical axis of the lens is controlled so that the measuring light reflected by the subject surface has a plane wave. On the other hand, an amount of relative displacement between the object lens and the subject surface is detected, based on a heterodyne interference between a light beam reflected by a stationary mirror and a light beam reflected by a movable mirror which is moved as the relative position is changed. The surface condition is detected based on the amount of relative displacement between the object lens and the subject surface which is detected when said plane wave of said measuring light beam is obtained.
REFERENCES:
patent: 4848908 (1989-07-01), Huang
Bessho Yoshinori
Fujita Kazuhiko
Brother Kogyo Kabushiki Kaisha
Turner Samuel
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