Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate
2006-07-11
2006-07-11
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
For fault location
C324S530000, C324S686000
Reexamination Certificate
active
07075307
ABSTRACT:
The present invention is a method an apparatus for diagnosing short defects on inaccessible or non-contacted nodes of an integrated circuit device using capacitive coupling techniques. In accordance with the invention, an alternating current (AC) signal generator is connected to apply an alternating current (AC) signal to an accessible node of an IC device under test. Preferably, all remaining accessible nodes of the IC device under test are grounded. A sensor plate of a capacitive sensing probe is placed in signal coupling proximity to the inaccessible node of interest on the integrated circuit device. If a signal is present on the inaccessible node of interest, it is capacitively coupled to the sensor plate of the probe. A measurement device obtains a measurement representative of an amount of current flow capacitively coupled to the sensor plate by the capacitive sensing probe. The possible existence of a short defect between the stimulated accessible node and the inaccessible node can be inferred based on the measurement and/or on a parameter derived from the measurement.
REFERENCES:
patent: 5420500 (1995-05-01), Kerschner
patent: 5498964 (1996-03-01), Kerschner et al.
patent: 5557209 (1996-09-01), Crook et al.
patent: 6104198 (2000-08-01), Brooks
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