Method and apparatus for detecting short circuit point between w

Details Method and apparatus for detecting short circuit point between w Method and apparatus for detecting short circuit point between w

1995-07-28

1997-06-17

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324765, 324501, G01R 31302

Patent

active

056400993

ABSTRACT:
A short circuit point is detected between wiring patterns on an integrated circuit which includes functional circuits and wiring patterns. For this purpose, an apparatus includes a power supply unit for applying a predetermined voltage between power supply wiring patterns of the integrated circuit such that the functional circuits are in a non-operating state. A current consumed between the power supply wiring patterns is continuously monitored. In this state, a laser beam is irradiated to a predetermined point on the integrated circuit and a current change amount is detected in response to the irradiation of the laser beam. The detection operation is performed for all the predetermined points. A short circuit point is determined between the wiring patterns from data indicating the current change amounts at the predetermined points.

REFERENCES:
patent: 4698587 (1987-10-01), Burns et al.
patent: 4761607 (1988-08-01), Shiragasawa et al.
patent: 5017863 (1991-05-01), Mellitz
patent: 5053699 (1991-10-01), Aton
patent: 5309108 (1994-05-01), Maeda et al.
Masaru Sanada, "Very Sensitive Detection for LSI's Hot Spots Using Liquid Crystals", 6th Int'l. Conference on Reliability and Maintainability, Oct. 1988, Strasbourg, France, pp. 516-521.

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