Method and apparatus for detecting semiconductor...

Details Method and apparatus for detecting semiconductor... Method and apparatus for detecting semiconductor...

2006-05-30

2006-05-30

Wells, Kenneth B. (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

Specific signal discriminating without subsequent control

By amplitude

C327S066000

Reexamination Certificate

active

07053672

ABSTRACT:
The present invention discloses a skew detection device which can detect a skew of a transistor changed due to a driving voltage, a size and a process variable. The skew detection device includes a first potential level generator for outputting a first voltage, a second potential level generator for outputting a second voltage, a first level shifter for receiving the first voltage and outputting a first shift voltage, a second level shifter for receiving the second voltage and outputting a second shift voltage, and a comparator for comparing the first shift voltage with the second shift voltage. The first voltage is determined according to a drain-source current of a first MOS transistor operated in a linear region, and the second voltage is determined according to a drain-source current of a second MOS transistor operated in a saturation region.

REFERENCES:
patent: 5963079 (1999-10-01), Hoang
patent: 6573746 (2003-06-01), Kim et al.

Affiliated with

Also associated with

Rating

Method and apparatus for detecting semiconductor... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for detecting semiconductor..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for detecting semiconductor... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3610904