Method and apparatus for detecting Mura defects

Details Method and apparatus for detecting Mura defects Method and apparatus for detecting Mura defects

1998-02-04

2000-11-28

Mehta, Bhavesh

Image analysis

Applications

Manufacturing or product inspection

382149, 345904, 348125, G06K 900

Patent

active

061545619

ABSTRACT:
A method for locating blobs in an image, includes the steps of: forming a blob reference mask from the image, the blob reference mask including a portion indicating a portion of the image containing a first blob, if any, and forming a reference image from the image, the reference image corresponding to the image. The method also includes the steps of forming a modified image from the image by replacing the portion of the image containing the first blob, if any, with a portion of the reference image corresponding to the portion of the image, and locating a second blob in the image in response to the modified image.

REFERENCES:
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patent: 5650844 (1997-07-01), Aoki et al.
patent: 5717780 (1998-02-01), Mitsumune et al.
patent: 5917934 (1999-06-01), Chiu et al.
patent: 5917935 (1999-06-01), Hawthorne et al.
patent: 5966458 (1999-10-01), Yukawa et al.

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