Thermal measuring and testing – Leak or flaw detection
Patent
1988-10-18
1990-04-03
Cuchlinski, Jr., William A.
Thermal measuring and testing
Leak or flaw detection
358100, 358113, 73 405R, 354 63, G01N 2572, H04N 718
Patent
active
049135589
ABSTRACT:
Defects in an underground channel, such as a sewer, are detected by an infrared scanning device (preferably an infrared video camera) moved internally along the channel. The scanning device senses temperature deviations which mark defects in the channel, as, for example, deviations due to the inflow of cool extraneous water into a sewer. The scanning device is in communication with an above-ground central unit which processes the scanning device output and displays and/or records thermal representations of the defect. The central unit also monitors the location (distance travelled) of the scanning device so that the locations of defects may be determined.
REFERENCES:
patent: 3168909 (1965-02-01), Zurbrigen et al.
patent: 3453869 (1969-07-01), Cherne
patent: 3715484 (1973-02-01), Latall
patent: 3739089 (1973-06-01), Latall
patent: 3771350 (1973-11-01), Romans
patent: 3832724 (1974-08-01), Duval
patent: 3885091 (1975-05-01), Fish et al.
patent: 4272781 (1981-06-01), Taguchi et al.
patent: 4403251 (1983-09-01), Domarenok et al.
patent: 4612797 (1986-09-01), Barkhoudarian
patent: 4626905 (1986-12-01), Schmidt
Ericsson Bo
Wettervik Lennart
Cuchlinski Jr. William A.
Scanlon Patrick R.
Wettervik Lennart
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