X-ray or gamma ray systems or devices – Specific application – Absorption
Patent
1997-06-19
1998-12-08
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Absorption
378 55, G01B 1506
Patent
active
058481184
ABSTRACT:
A method and apparatus is provided for inspection in real-time of inhomogeneities at particular locations of objects using x-radiation. An object is fixed on a conveyor by a system of clamps, and a manipulator positions an x-ray source and detector such that the particular location to be inspected is between the two. X-ray photons passing through the spot to be inspected are recorded by the detector. When the manipulator is at the required position, the electronic control system (ECS) gives a `start` signal and the monitor begins to count the pulses from the detector. After a specified time, a `stop` signal passes from the ECS, and the monitor stops counting, while the manipulator passes to the following position to be inspected. The information coming from the detector is processed in the monitor. If no inhomogeneities are detected, the monitor gives permission for inspection of the following object, otherwise an alarm signal is triggered.
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Lear Corporation
Porta David P.
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