Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent
1991-05-28
1993-02-02
McGraw, Vincent P.
Optics: measuring and testing
Inspection of flaws or impurities
Transparent or translucent material
250562, G01N 2188, G01N 2189
Patent
active
051841908
ABSTRACT:
Flaws and defects in heat seals formed between sheets of translucent film are identified by optically examining consecutive lateral sections of the seal along the seal length. Each lateral seal section is illuminated and an optical sensor array detects the intensity of light transmitted through the seal section for the purpose of detecting and locating edges in the heat seal. A line profile for each consecutive seal section is derived having an amplitude proportional to the change in light intensity across the seal section. Instances in the derived line profile where the amplitude is greater than a threshold level indicate the detection of a seal edge. The detected edges in each derived line profile are then compared to a preset profile edge standard to identify the existence of a flaw or defect.
REFERENCES:
patent: 1763109 (1930-06-01), Strobl
patent: 3656066 (1972-04-01), Reynal
patent: 3754146 (1973-08-01), Chow
patent: 4110048 (1978-08-01), Akutsu et al.
patent: 4212192 (1980-07-01), Taylor
patent: 4274748 (1981-06-01), Burtin et al.
patent: 4302106 (1981-11-01), Taylor
patent: 4377341 (1983-03-01), Task et al.
patent: 4461570 (1984-07-01), Task et al.
patent: 4647197 (1987-03-01), Kitaya et al.
patent: 4679075 (1987-07-01), Williams et al.
patent: 4776692 (1988-10-01), Kalawsky
patent: 4877205 (1989-10-01), Rand
patent: 4993830 (1991-02-01), Jarrett, Jr.
patent: 5068799 (1991-11-01), Jarrett, Jr.
"The Systronics Eagle" Systronics Inc, 6400 Atlantic Boulevard, Norcross, Ga.
Lew Thomas M.
Rai Kula R.
Sinclair Robert B.
McGraw Vincent P.
O'Neil Michael A.
Winzen International, Inc.
LandOfFree
Method and apparatus for detecting flaws and defects in heat sea does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for detecting flaws and defects in heat sea, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for detecting flaws and defects in heat sea will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-10037