Method and apparatus for detecting faults in transparent...

Details Method and apparatus for detecting faults in transparent... Method and apparatus for detecting faults in transparent...

2007-11-06

2007-11-06

Chowdhury, Tarifur (Department: 2886)

Optics: measuring and testing

Inspection of flaws or impurities

Transparent or translucent material

Reexamination Certificate

active

10812161

ABSTRACT:
The method for detecting faults in transparent material includes irradiating a definite partial volume in the material with a first radiation source and coupling light into the material from a second source so that its optical path in the partial volume extends in the interior of the material. A fault in the partial volume is detected by light scattering, bright field absorption, and/or deflection of light of the first radiation source by the fault. The apparatus for detecting faults includes a first radiation source for illuminating a definite partial volume of the material, a detector for detecting light from this partial volume, and a second radiation source. The second radiation source is arranged in relation to the material so that the associated optical path in the partial volume passes exclusively in the interior of the material.

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Patent Abstracts of Japan, JP 10-339795, Published Dec. 22, 1998.

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