Image analysis – Histogram processing – For setting a threshold
Patent
1987-01-30
1989-10-24
Boudreau, Leo H.
Image analysis
Histogram processing
For setting a threshold
73598, 356237, 358106, 382 34, G06K 962
Patent
active
048767271
ABSTRACT:
The subject of the invention is a method and a device for detecting faults in or on an object. The object form is measured and then compared with a master form. In this comparison one point and one line of the object form and of the master form with reference to a coordinate system, are brought into coincidence by shifting the form or master form. Partial forms and partial master forms are then displaced relative to one another in partial areas of the coordinate system until a maximum overlap is detected. Then the nonoverlapping points of the partial forms are checked for faults.
REFERENCES:
patent: 3576534 (1969-08-01), Steinberger
patent: 4079416 (1978-03-01), Faani
patent: 4091394 (1978-05-01), Kashioka
patent: 4111557 (1978-09-01), Rottenkolber
patent: 4160385 (1979-07-01), Gromlich
patent: 4435835 (1984-03-01), Sakow
patent: 4579455 (1986-04-01), Levy
patent: 4613234 (1986-09-01), Cruickshank
patent: 4635293 (1987-01-01), Watanabe
patent: 4644582 (1987-02-01), Morishita et al.
patent: 4707734 (1987-11-01), Labinger
Fabian Josef
Maurer Albrecht
Boudreau Leo H.
Nukem GmbH
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