Method and apparatus for detecting dielectric defects

Details Method and apparatus for detecting dielectric defects Method and apparatus for detecting dielectric defects

1986-10-16

1989-02-07

Paschall, M. H.

Electricity: measuring and testing

A material property using electrostatic phenomenon

For flaw detection

324452, G01N 2760

Patent

active

048034355

ABSTRACT:
Small and/or large defects in dielectric materials can be detected by bombarding one surface of the dielectric material with gas ions in order to impart a charge on that surface while the opposite surface is under the influence of an opposite charge. The dielectric material is then exposed to an indicator substance having an affinity for the charge of the gas ions and a tendency to congregate on regions of the dielectric materials which contain defects.

REFERENCES:
patent: 2499467 (1950-03-01), De Forest et al.
patent: 2669692 (1954-02-01), Pearson
patent: 2678420 (1954-05-01), De Forest et al.
patent: 3234462 (1966-02-01), Holdsworth
patent: 4251775 (1981-02-01), Michel
patent: 4443764 (1984-04-01), Suh et al.
patent: 4463316 (1984-07-01), Messins et al.
patent: 4578279 (1986-03-01), Zingher
patent: 4668916 (1987-05-01), Pech

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