Method and apparatus for detecting deformations of leads of semi

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356394, G01N 2186

Patent

active

052084639

ABSTRACT:
Method and apparatus for detecting vertical and horizontal deformations of leads of a semiconductor device by illuminating the leads with a planar light beam and determining relative positions of the planar light beam on the leads on the basis of distribution of light rays reflected from the leads. Different lead deformations can be detected with one and the same mechanism within a short time. By applying the invention to a semiconductor device mounting apparatus, a single detector can be employed in common both for the detection of the semiconductor device position and the detection of reflections of the planar beam.

REFERENCES:
patent: 4739175 (1988-04-01), Tamura
patent: 4772125 (1988-09-01), Yoshimura et al.
patent: 4875779 (1989-10-01), Luebbe et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for detecting deformations of leads of semi does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for detecting deformations of leads of semi, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for detecting deformations of leads of semi will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1977181

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.