Method and apparatus for detecting defects in repeated micromini

Details Method and apparatus for detecting defects in repeated micromini Method and apparatus for detecting defects in repeated micromini

1987-12-03

1989-07-04

Britton, Howard W.

Facsimile and static presentation processing

Facsimile

Specific signal processing circuitry

358101, 358107, H04N 718

Patent

active

048455580

ABSTRACT:
A method of inspecting repeating pattern devices according to which an image of the patterns is aligned with an array of pixels in the image detection plane of an optical detector. The image is magnified to a scale so that features of patterns repeated in the image occupy corresponding pixels or groups of pixels repeated in the array. Data is resolved from selected pixels and directly compared either to data obtained from corresponding pixels or from a data base, whereby defective features are identified through well-known data comparison techniques.

REFERENCES:
patent: 4347001 (1982-08-01), Levy
patent: 4553834 (1985-11-01), Ayata
patent: 4559603 (1985-12-01), Yoshikawa
patent: 4579455 (1986-04-01), Levy

Affiliated with

Also associated with

Rating

Method and apparatus for detecting defects in repeated micromini does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for detecting defects in repeated micromini, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for detecting defects in repeated micromini will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-856651