Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent
1981-12-24
1984-05-08
McGraw, Vincent P.
Optics: measuring and testing
Inspection of flaws or impurities
Having predetermined light transmission regions
356378, G01N 2188
Patent
active
044471521
ABSTRACT:
A method and apparatus for detecting defects in apertures plates such as masks. The plate is illuminated by a collimated light beam and defects or irregularities are signalled by a bright spot of light. A modified microfilm reader or the like can be used to magnify and project an image of that portion of the plate associated with the bright spot of light.
REFERENCES:
patent: 4099881 (1978-07-01), Vanden Broek et al.
patent: 4319840 (1982-03-01), Kondo et al.
Kutch, "Inspection Apparatus for Apertured Green Sheets," IBM Tech. Disc. Bulletin, vol. 20, No. 7, Dec. 1977, pp. 2678-2679.
Moser Mark M.
Ojala Jon R.
Rainford Robert E.
IBM Corp.
McGraw Vincent P.
LandOfFree
Method and apparatus for detecting defects in apertured plates does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for detecting defects in apertured plates, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for detecting defects in apertured plates will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1599987