Image analysis – Histogram processing – For setting a threshold
Patent
1986-04-15
1988-08-16
Boudreau, Leo H.
Image analysis
Histogram processing
For setting a threshold
324 64, 324158P, 358101, 358106, 358107, 364507, 382 1, G06K 900
Patent
active
047649704
ABSTRACT:
The invention scans potential measurement terminals on the surface of a structural member to measure a potential distribution on the surface, detects the direction of a crack from the potential distribution and determining a detailed potential distribution in the direction of the crack thus detected. This potential distribution is compared with master curves of the potential distributions of cracks of various shapes, that have been obtained by analysis in advance, in order to detect the shape of the crack. The present invention can detect accurately a crack shape.
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patent: 4267506 (1981-05-01), Shiell
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Baudin et al, "A Pulsed d.c. P.D. Technique-Applications to Three-Dimensional Crack Fronts", pp. 159-174.
Hayashi Makoto
Otaka Masahiro
Sakata Shinji
Shimizu Tasuku
Boudreau Leo H.
Couso Jose L.
Hitachi , Ltd.
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