Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-03-14
2011-11-15
Natalin, Jeff (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S681000
Reexamination Certificate
active
08058883
ABSTRACT:
Disclosed herein is a method for detecting capacitance including: allowing an oscillator to output a plurality of time division oscillation frequencies according to the capacitance detected by a capacitance detection plate; counting the plurality of time division oscillation frequencies during a predetermined time period; and offsetting increasing and decreasing of the oscillation frequencies due to noise such that a count value becomes uniform over the predetermined time period. Even when external noise is applied, distortion of the oscillation frequency due to the external noise is minimized and the oscillation frequency varies depending on only the capacitance of the capacitance detection plate. Accordingly, it is possible to prevent an error due to the noise at the time of the detection of the capacitance.
REFERENCES:
patent: 5296374 (1994-03-01), Culshaw et al.
patent: 5726567 (1998-03-01), Lewis et al.
patent: 6326795 (2001-12-01), Matsumoto et al.
patent: 7091727 (2006-08-01), Lee
patent: 7138809 (2006-11-01), Nakamura et al.
patent: 2006/0055417 (2006-03-01), Lee
patent: 0 303 442 (1989-02-01), None
patent: A-9-89943 (1997-04-01), None
patent: 10-2006-0021202 (2006-03-01), None
AD Semiconductor Co., Ltd.
Natalin Jeff
Oliff & Berridg,e PLC
LandOfFree
Method and apparatus for detecting capacitance using a... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for detecting capacitance using a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for detecting capacitance using a... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4276716