Method and apparatus for detecting artifact corners in two-dimen

Image analysis – Pattern recognition – Feature extraction

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235462, G06K 900

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054188628

ABSTRACT:
A system for finding a corner of an artifact in a two-dimensional pixel image selects an original seed pixel and generates a reference vector using the original seed pixel. The system selects a next seed pixel using the original seed pixel and generates a current vector using the next seed pixel. The system compares the current vector to the reference vector and selects a corner based on that comparison. Also a system for finding a corner of a bar code symbol in a two-dimensional pixel image selects a sequence of seed pixels, having a first seed pixel and a plurality of successive seed pixels, where each successive seed pixel is selected in accordance with the previous seed pixel in the sequence. The system generates a reference vector in accordance with the first seed pixel and generates a plurality of successive vectors, each in accordance with a successive seed pixel. The system compares the reference vector to each of the successive vectors and selects a corner in accordance with the comparison.

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