Chemistry: physical processes – Physical processes – Crystallization
Patent
1977-09-07
1979-04-10
Scovronek, Joseph
Chemistry: physical processes
Physical processes
Crystallization
23232E, 356316, 422 83, 422 98, G01J 334, G01N 2762
Patent
active
041486129
ABSTRACT:
Trace impurities in flowing gases may be detected and measured by a dynamic atomic molecular emission spectrograph utilizing as its energy source the energy transfer reactions of metastable species, atomic or molecular, with the impurities in the flowing gas. An electronically metastable species which maintains a stable afterglow is formed and mixed with the flowing gas in a region downstream from and separate from the region in which the metastable species is formed. Impurity levels are determined quantitatively by the measurement of line and/or band intensity as a function of concentration employing emission spectroscopic techniques.
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West et al., Anal. Chem. 36, 412 (1964).
Heemstra et al., Anal. Chem. 38, 492 (1966).
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Taylor et al., Anal. Chem. 42, 876 (1970).
Dowdy Edward J.
Taylor Gene W.
Carlson Dean E.
Scovronek Joseph
The United States of America as represented by the United States
Walterscheid Edward C.
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