Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
Reexamination Certificate
2006-06-27
2006-06-27
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Mechanical measurement system
C700S175000, C700S176000, C073S598000, C073S599000, C073S600000, C702S182000
Reexamination Certificate
active
07069154
ABSTRACT:
A method and apparatus for detecting and automatically identifying defects in technical equipment, is disclosed. Measurement signals varying in time are downloaded as spectrograms to a computer memory. Using a predetermined criteria a set of designated peak values is created. Using another predetermined criteria the set of designated peak values is divided into two subsets. Then in one of the subsets, peak groups differing from each other by the basic frequency values are distinguished. The second subset, created from the set of designated peak values, is searched for the presence of sidebands for peaks from each specified peak group and if the sidebands are present the basic frequency of the sidebands is calculated. Then the existence of a defect in the technical equipment is detected, and identified by comparing the basic frequencies and the basic frequencies of the sidebands with the frequency values collected in the computer memory.
REFERENCES:
patent: 5483833 (1996-01-01), Dickens et al.
patent: 5686669 (1997-11-01), Hernandez et al.
patent: 5875420 (1999-02-01), Piety et al.
ABB SP.ZO.O.
Barlow John
Kundu Sujoy
Rickin Michael M.
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