Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate
2006-12-26
2006-12-26
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Quality evaluation
C365S185090, C365S185290, C713S001000
Reexamination Certificate
active
07155357
ABSTRACT:
An unused state detection circuit is disclosed that detects an unused state in a semiconductor circuit. A semiconductor circuit is “unused” when the unused state detection circuit has not been permanently cleared. When a semiconductor circuit is first powered up, the unused state detection circuit will detect that the semiconductor circuit has not previously been “used” and can automatically activate a boot up procedure or a testing procedure (or both). After the semiconductor circuit is used, the unused state detection circuit provides an indication that the semiconductor circuit is no longer unused. The unused state detection circuit uses the state of a dedicated non-volatile memory array or a dedicated region of the general non-volatile memory portion of the semiconductor circuit to detect whether the semiconductor circuit has been previously unused.
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Bui Bryan
DLA Piper (US) LLP
Le John H.
LandOfFree
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