Method and apparatus for detecting abnormality in analog-to-digi

Details Method and apparatus for detecting abnormality in analog-to-digi Method and apparatus for detecting abnormality in analog-to-digi

1993-12-09

1995-07-11

Young, Brian K.

Coded data generation or conversion

Converter calibration or testing

341155, H03M 110

Patent

active

054325145

ABSTRACT:
A reference voltage for an analog-to-digital (A/D) converting unit is converted into plural digital values through the effect of the A/D converting unit. A difference between an average value of the digital values and an ideal reference value is derived. If the different is larger than a predetermined allowable value, it is determined that a transient abnormality takes place in an A/D converter system. The last measured reference voltage and its related digital input signal are disallowed to be used as measured values. If detection of a transient abnormality serially takes place predetermined times, it is determined that a constant abnormality takes place in the A/D converter system.

REFERENCES:
patent: 4535319 (1985-08-01), Penny

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